BibTex Citation Data :
@article{J.Gauss26637, author = {Farhah Jannah and Sudarno Sudarno and Alan Prahutama}, title = {KAJIAN RELIABILITAS PADA SISTEM SERI-PARALEL DENGAN EMPAT KOMPONEN}, journal = {Jurnal Gaussian}, volume = {7}, number = {1}, year = {2018}, keywords = {Reliability, Series-Parallel, MRRE, MLE, AD.}, abstract = { Reliability analysis is the analysis of the possibility that the product or service will function properly for a certain period of time under operating conditions without failure. One configuration of components that can be formed is a series-parallel system on a filter capacitor circuit using 4 components consisting of 2 rectifier diodes, 1 capacitor, and 1 load resistor. The data used to obtain the value of system reliability is the time of failure based on the assumption of failure of the independent component. The function of the form on the system can be expressed by Ф( x )= x 1 x 3 + x 1 x 4 + x 2 x 3 + x 2 x 4 - x 1 x 3 x 4 - x 2 x 3 x 4 - x 1 x 2 x 3 - x 1 x 2 x 4 + x 1 x 2 x 3 x 4 . The parameter values of each distribution are calculated using the Median Rank Regression Estimation (MRRE) and Maximum Likelihood Estimation (MLE) methods. To test the data following a certain distribution or not, the calculation is manually done with the Anderson-Darling (AD) test so that it is known that the failure time data of rectifier diode 1 follows the weibull distribution with parameters and , failure time data of rectifier diode 2 follows weibull distribution with parameters and , failure time data of capacitors follow normal distribution with parameters and , and the failure time data of the load resistor following the gamma distribution with parameters and . From the calculation of system reliability, it shows that the higher the intensity of the system fails it will affect the value of reliability to be lower. A serial system from a parallel system functions if there is at least one component j in one subsystem that functions. Keywords: Reliability, Series-Parallel, MRRE, MLE, AD. }, issn = {2339-2541}, pages = {73--83} doi = {10.14710/j.gauss.7.1.73-83}, url = {https://ejournal3.undip.ac.id/index.php/gaussian/article/view/26637} }
Refworks Citation Data :
Reliability analysis is the analysis of the possibility that the product or service will function properly for a certain period of time under operating conditions without failure. One configuration of components that can be formed is a series-parallel system on a filter capacitor circuit using 4 components consisting of 2 rectifier diodes, 1 capacitor, and 1 load resistor. The data used to obtain the value of system reliability is the time of failure based on the assumption of failure of the independent component. The function of the form on the system can be expressed by Ф(x)= x1x3 + x1x4 + x2x3 + x2x4 - x1x3x4 - x2x3x4 - x1x2x3 - x1x2x4 + x1x2x3x4. The parameter values of each distribution are calculated using the Median Rank Regression Estimation (MRRE) and Maximum Likelihood Estimation (MLE) methods. To test the data following a certain distribution or not, the calculation is manually done with the Anderson-Darling (AD) test so that it is known that the failure time data of rectifier diode 1 follows the weibull distribution with parameters and , failure time data of rectifier diode 2 follows weibull distribution with parameters and , failure time data of capacitors follow normal distribution with parameters and , and the failure time data of the load resistor following the gamma distribution with parameters and . From the calculation of system reliability, it shows that the higher the intensity of the system fails it will affect the value of reliability to be lower. A serial system from a parallel system functions if there is at least one component j in one subsystem that functions.
Keywords: Reliability, Series-Parallel, MRRE, MLE, AD.
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